Aslanoglou XA, Evangelou E, Konofaos N, Dimitriades C, Kossionides E, Kaliampakos G, Kriembardis G. Oxygen Contamination of Multilayer TiNx — SiO2 — Si Structures found by Resonant RBS Analysis. HNPS Adv Nucl Phys [Internet]. 2019 Dec. 5 [cited 2024 May 9];10:20-5. Available from: https://eproceedings.epublishing.ekt.gr/index.php/hnps/article/view/2170