Noli F, Misaelides P, Kokkoris M, Riviere JP. Application of ion beam analysis for the characterization of SiC- and DLC-thin films. HNPS Adv Nucl Phys [Internet]. 2020 Jan. 1 [cited 2025 Dec. 5];15:269-72. Available from: https://eproceedings.epublishing.ekt.gr/index.php/hnps/article/view/2610