Karydas, A. G., Ch. Zarkadas, A. Kyriakis, J. Pantazis, A. Huber, R. Redus, C. Potiriadis, and T. Paradellis. “X-Ray Spectrometric Studies Using Thin Silicon Crystals. Advantages and Applications”. HNPS Advances in Nuclear Physics 11 (December 5, 2019). Accessed April 28, 2024. https://eproceedings.epublishing.ekt.gr/index.php/hnps/article/view/2234.