Karydas, A. G., Zarkadas, C., Kyriakis, A., Pantazis, J., Huber, A., Redus, R., Potiriadis, C. and Paradellis, T. (2019) “X-Ray spectrometric studies using thin silicon crystals. Advantages and applications”, HNPS Advances in Nuclear Physics, 11. doi: 10.12681/hnps.2234.