NOLI, F.; MISAELIDES, P.; KOKKORIS, M.; RIVIERE, J. P. Application of ion beam analysis for the characterization of SiC- and DLC-thin films. HNPS Advances in Nuclear Physics, [S. l.], v. 15, p. 269–272, 2020. DOI: 10.12681/hnps.2610. Disponível em: https://eproceedings.epublishing.ekt.gr/index.php/hnps/article/view/2610. Acesso em: 8 may. 2024.