KARYDAS, A. G.; ZARKADAS, C.; KYRIAKIS, A.; PANTAZIS, J.; HUBER, A.; REDUS, R.; POTIRIADIS, C.; PARADELLIS, T. X-Ray spectrometric studies using thin silicon crystals. Advantages and applications. HNPS Advances in Nuclear Physics, [S. l.], v. 11, 2019. DOI: 10.12681/hnps.2234. Disponível em: https://eproceedings.epublishing.ekt.gr/index.php/hnps/article/view/2234. Acesso em: 27 apr. 2024.