ASLANOGLOU, X. A.; EVANGELOU, E.; KONOFAOS, N.; DIMITRIADES, C.; KOSSIONIDES, E.; KALIAMPAKOS, G.; KRIEMBARDIS, G. Oxygen Contamination of Multilayer TiNx — SiO2 — Si Structures found by Resonant RBS Analysis. HNPS Advances in Nuclear Physics, [S. l.], v. 10, p. 20–25, 2019. DOI: 10.12681/hnps.2170. Disponível em: https://eproceedings.epublishing.ekt.gr/index.php/hnps/article/view/2170. Acesso em: 8 may. 2024.