Karydas, A. G., Zarkadas, C., Kyriakis, A., Pantazis, J., Huber, A., Redus, R., Potiriadis, C., & Paradellis, T. (2019). X-Ray spectrometric studies using thin silicon crystals. Advantages and applications. HNPS Advances in Nuclear Physics, 11. https://doi.org/10.12681/hnps.2234