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Karydas, A. G.; Zarkadas, C.; Kyriakis, A.; Pantazis, J.; Huber, A.; Redus, R.; Potiriadis, C.; Paradellis, T. X-Ray Spectrometric Studies Using Thin Silicon Crystals. Advantages and Applications. HNPS Adv Nucl Phys 2019, 11.