Aslanoglou, X. A.; Evangelou, E.; Konofaos, N.; Dimitriades, C.; Kossionides, E.; Kaliampakos, G.; Kriembardis, G. Oxygen Contamination of Multilayer TiNx — SiO2 — Si Structures Found by Resonant RBS Analysis. HNPS Adv Nucl Phys 2019, 10, 20-25.