Karydas, A.G., Zarkadas, C., Kyriakis, A., Pantazis, J., Huber, A., Redus, R., Potiriadis, C. and Paradellis, T. 2019. X-Ray spectrometric studies using thin silicon crystals. Advantages and applications. HNPS Advances in Nuclear Physics. 11, (Dec. 2019). DOI:https://doi.org/10.12681/hnps.2234.